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2014 04 v.34 413-420
原子层沉积技术的发展现状及应用前景
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安徽大学物理与材料科学学院;

摘要(Abstract):

随着微电子行业的发展,集成度不断提高、器件尺寸持续减小,使得许多传统微电子材料和科技面临巨大挑战,然而原子层沉积(ALD)技术作为一种优异的镀膜技术,因其沉淀的薄膜纯度高、均匀性及保行性好,还能十分精确地控制薄膜的厚度与成分,仍然备受关注并被广泛应用于半导体、光学、光电子、太阳能等诸多领域。本文简要介绍了ALD技术的原理、沉积周期、特征、优势、化学吸附自限制ALD技术和顺次反应自限制ALD技术及ALD本身作为一种技术的发展状况(T-ALD,PEALD和EC-ALD等);重点叙述了ALD技术在半导体领域(高k材料、IC互连技术等)、光学薄膜方面、纳米材料方面、催化剂的应用和新成果。最后,对ALD未来的发展应用前景进行了展望。

关键词(KeyWords): 原子层沉积技术;;薄膜沉积;;高k材料;;光学薄膜;;催化剂
参考文献 [1]KimH.Journal of Vacuum Science Technology[J],2003,B21(6):2231-2261
[2]Lim B S,Rahtu A,Gordon R G.Nature Materials[J],2003,(11):749-754
[3]SchumacherM,Baumann P K,Seidel T.Thin-Film Processing[J],2006,12(2-3):99-108
[4]Yuan J P,Wei L,Guo W X.Surface Technology[J],2010,39(4):77-82
[5]Shen C,Liu X Y,HuangG Z.Vacuun[J],2006,43(4):1-6
[6]Qiu HB,Liu B W,Xia Y,et al.Micronanoelectronic Technology[J],2012,49(11):702-708
[7]Editorial Office of EPE.Equipment for Electronic Products Manufacturing[J],2010,180:1-7
[8]Shen C,Liu X Y,HuangG Z.Vacuun[J],2006,43(4):1-6
[9]Cao YQ,Li A D.Measurement and Equipment[J],2012,49(7):483-490
[10]Kwon O K,Kwon S H,Park HS,et al.Journal of the Electrochemical Society Volume[J],2004,151(12):753-756
[11]Kwon OK,KwonSH,ParkHS,et al.Electrochemical SolidState Letters[J],2004,7(4):46-48
[12]Kim W H,Maeng W J,Moon K J.Thin Solid Films[J],2010,519(1):362-366
[13]Hou J,Yang J,Zhu W.Materials Review[J],2005,19(9):87-90
[14]Fomi F,Innoeenti M,Pezzatini G.Electrochemical Acta[J],2000,45(20):3225-323l
[15]Flowers B H,Wade TL,Garvey J W.Journal of Electroanalytical Chemistry[J],2002,524-525(3):273-285
[16]Varazo K,Lay MD,Sorenson TA.Journal of Electroanalytical Chemistry[J],2002,522(22):104-114
[17]Mathe M K,Cox S M,Flowers B H.Journal of Crystal Growth[J],2004,271(51):55-64
[18]Zhang X,Shi XZ,Wang CM.Journal of Solid State Electrochemistry[J],2009,13(3):469-475
[19]Villegas I,Stickney J L.Chemical Society Reviews Home[J],1992,139(3):686-694
[20]Innocenti M,Fomi F,Pezzatini G.Journal of Electroanalytical Chemistry[J],2001,514(16):75-82
[21]Liu XK,Studied on Plasma-Enhanced Atomic LayerDeposition[Master's Thesis],Donghua University,2012-05
[22]Sang LJ,Zhang YF,Chen Q,et al.Chinese Journal of Vacuum Science and Technology[J],2010,30(3):293-296
[23]Yu H Q,Zuo R.Science Technology and Engineering[J],2011,30(11):7334-7338
[24]Sherman H.L,Atomic Layer Deposition for Nanotechnology[J].Ivory ton Press,2008
[25]Leskela M,Ritala M.Thin Solid Films[J],2002,409:138-146
[26]Yie W B,Huang G Z,Zhu J M,et al.Chinese Journal of Vacuum Science and Technology[J],2011,31(1):57-60
[27]Shen C,HuangGZ,MaG X,et al.Chinese Journal ofVacuum Science and Technology[J],2009,29(2):125-129
[28]Huang Y J,Pandraud G,Sarro PM.Journal of Vacuum Science&Technology[J],2013,A31(1):01A148
[29]Liu J W,Liao M Y,Imura M,et al.Applied Physics Letters[J],2013,102(11):112910-1-3
[30]Wang Q.Studies Investigation on Characteristics of Atomic Layer Deposited Titanium Dioxide Stack Gate Structure Dielectric,[Master Thesis],Xidian University,2012-01
[31]Cheon T,Choi S H,Kim S H.Electrochemical and SolidState Letters[J],2011,14(5):57-61
[32]Wang C C,Kei C C,Yu YW.et al.Nano Letters[J],2007,7(6):1566-1569
[33]Niinist¨o J,Putkonen M,Niinist¨o L,et al.Chemical Materials[J],2007,19(13):3319-3324
[34]Ferguson J D,Weimer AW,GeorgeS M.Chemical Materials[J],2004,16(26):5602-5609
[35]Pourret A,Guyot-Sionnest P,Elam J W.Advanced Materials[J],2009,21(2):232-235
[36]Graugnard E,Roche O M,Dunham S N.Applied Physics Letters[J],2009,94(26):263109-1-3
[37]Yao Z N.Study on High Dielectric Constant of Atomic Layer Deposition and Nano Device Applications.[Master Thesis],Northwesten University,2010-06
[38]Fu YY.Study on Preparation and Characterization of Atomic Layer DepositionDerived Thin Films for Microelectronic Applications[J].Master thesis,2012-05
[39]He J P,Zhang Y G,Shen W D,et al.Chinese Journal of Vacuum Science and Technology[J],2009,29(2):173-179
[40]He J P,Zhang Y G,Shen W D,et al.Acta Optica Sinica[J],2010,30(1):277-282
[41]Fan HH,Zhang Y G,Shen W D,et al.Acta Optica Sinica[J],2011,31(10):103100-1--1031001-6
[42]Zhang Z M,Guo C Y,Ma B.Industrial Catalysis[J],2012,20(6):23-26

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中图分类号:TN304.055

引用信息:

[1]魏呵呵,何刚,邓彬等.原子层沉积技术的发展现状及应用前景[J].真空科学与技术学报,2014,34(04):413-420.

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